MiniFlex XpC

Advanced Powder Diffraction Capabilities
•    Rapid, accurate XRD measurements for powders, bulk materials, and thin samples
•    High-throughput analysis for quality control in industrial environments
•    Compatible with automated workflows using conveyor belts or robotic sample handling
•    Reliable phase identification and structural analysis with reduced measurement times

The MiniFlex XpC is engineered to maintain consistent performance across multiple operators and high-volume workflows, minimizing variability and maximizing productivity.

Detector and Instrument Design
•    D/teX Ultra250 high-speed 1D detector: Larger detection area than previous models ensures higher signal intensity and faster data acquisition
•    Compact, high-output X-ray source: 800 W generator delivers lab-grade performance in a small footprint
•    High sensitivity and resolution: Optimized for detecting subtle differences in crystalline structures, even in challenging materials
The combination of advanced detector technology and high-output X-ray source enables precise measurements for quality control, while significantly reducing overall cycle time.
•    θ-θ horizontal goniometer: Compact, durable, and optimized for repetitive QC measurements
•    New sample loading mechanism: Allows safe and easy placement of samples without opening the instrument door, supporting both online and offline workflows
•    Automation-ready: Compatible with robotic arms, conveyor belts, and industry-standard sample holders
•    Compact footprint: Requires approximately 1 m² of floor space, ideal for crowded production environments
This design ensures consistent, reproducible results while enabling seamless integration into automated quality control lines.

Software and User Experience
•    EasyX quality control software: Streamlined interface for minimal clicks from measurement to analysis
•    Touch panel operation: Simple, intuitive control for operators of any skill level
•    Automated analysis: Includes pass/fail evaluation and trend visualization to track sample quality over time
•    Integration with SmartLab Studio II concepts: Leverages proven R&D-grade algorithms for reliable data

Technique X-ray diffraction (XRD)
Application Quality control and screening
Goniometer θ-θ horizontal sample goniometer
X-ray Source Compact 800 W generator
Detector D/teX Ultra250 1D high-resolution detector
Software EasyX, touch panel interface (based on SmartLab Studio II)
Dimensions (W×H×D) Approx. 700 × 1490 × 890 mm
Mass Approx. 250 kg
Power 1Ø, 200–230 V, 50/60 Hz, 6.5 A